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| E-Nano Newsletter (Issue 06) |
Publishing Date: 2007-01-01 |
Welcome to the issue nº06 of the "E-Nano Newsletter" that three-monthly provides scientific articles, reports and updated information on Nanotechnology and more specifically Emerging Nanoelectronics. The following contributions will be available
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"Exploring the Limits of Ion Beam Technology" by J. Gierak, P. Hawkes, R. Jede and NanoFIB partners |
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Pico-Inside Integrated Project:
Review on Non-Contact Atomic Force Microscopy (NC-AFM) |
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| "Dielectric Substrates for Anchoring Organic Molecules with Computing Functionally" by S. Hirth, F. Ostendrf, J. Schütte, R. Bechstein, A. Kühnle and M. Reichling |
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| "Non-Contact AFM as Indispensable Tool for Investigation of Patterned Insulators" by A. Socoliuc, Th. Glatzel, O. Pfeiffer, E. Gnecco, A. Baratoff, L. Nony and E. Meyer |
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| "Virtual AFM: NC-AFM from Experiments to Simulations" by O. Pfeiffer, L. Nony, D. Schär, A. Wetzel, A. Baratoff and E. Meyer |
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| "Molecular-Resolved Imaging with Non-Contact Atomic Force Microscopy (NC-AFM)" by J.J. Kolodziej, B. Such, F. Krok, M. Goryl and M. Szymonski |
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| "Atomic Resolution AFM on NaCl at 5K Using the QplPlus Sensor" by M. Maier, A. Bettac and A. Feltz |
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© Phantoms Foundation 2024 |
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