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Last Updated 29 March, 2006

Orals & Posters

Orals (Industrial Day) / Orals / Orals (Working Group) / Orals

Oral Contributions / Industrial Day
 
DeWolf
Peter
Veeco (France)
 
Gil
Adriana
Nanotec S.L. (Spain)
 
Heidari
Babak
Obducat AB (Sweden)
 
Kada
Gerald
Molecular Imaging (USA)
 
Kuehnholz
Joerg
SUSS MicroTec (France)
 
Kuschnerus
Peter
Carl Zeiss NTS GmbH (Germany)
 
Loeschner
Hans
IMS Nanofabrication GmbH (Austria)
 
Maier
Markus
Omicron Nanotechnology GmbH (Germany)
 
Villaret
Alexandre
ST Microelectronics (France)
 
Nouvertne
Frank
Raith GmbH (Germany)
 
Reng
Norbert
Carl Zeiss NTS GmbH (Germany)

 

Oral Contributions
 
Aassime
Abdelhanin
Universite Paris Sud (France)
 
Ahopelto
Jouni
VTT (Finland)
 
Chichkov
Boris
Laser Zentrum Hannover (Germany)
 
Csaki
Andrea
IPHT (Germany)
 
De Boeck
Jo
IMEC (Belgium)
 
Faucher
Marc
CEA-LETI (France)
 
Gallo
Pascal
LAAS/CNRS (France)
 
Ghibaudo
Gerard
IMEP-ENSERG (France)
 
Groening
Oliver
Swiss Federal Laboratories for Materials Testing & Research (Switzerland)
 
Latyshev
Alexander
Institute of Semiconductor Physics SB RAS (Russia)
 
Lenfant
Stephane
IEMN/MCMO (France)
 
Marks
Robert
Ben-Gurion University of the Negev (Israel)
 
Pain
Laurent
CEA/LETI (France)
 
Polonski
Vitali
Commonwealth Scientific & Industrial Research Organisation (CSIRO) (Australia)
 
Rojo-Romeo
Pedro
Ecole Centrale de Lyon (France)
 
Tranvouez
Edern
LPM (France)
 
Vidal
Bernard
L2MP / CNRS (France)

"Optics development in French (PREUVE) and European EUV Program (MEDEA); Application of Multilayer Coatings necessary in demonstrative tools"

 

 

Oral Contributions - Working Groups
 
Folsch
Stefan
Paul-Drude Institut for Solid State Electronics (Germany)
 
Gourdon
Andre
CEMES/CNRS (France)
 
Guedj
David
EC - IST/FET (Belgium)
 
Meyer
Gerhard
IBM Zurich (Switzerland)
 

 

Posters
 
Abed
Hichem
CRMCN (France)
 
Arnal
Thomas
IEMN (France)
 
Baraton
Laurent
CEA/DSM/DRECAM/SPCSI (France)
 
Desbief
Simon
L2MP/CNRS (France)
 
Egbert
Andre
phoenix|euv Systems + Services GmbH (Germany)
 
Gillet
Marcel
L2PM (France)
 
Gourgon
Cecile
LTM/CNRS (France)
 
Guerin
David
IEMN (France)
 
Mills
Chris
Barcelona Science Park (Spain)
 
Mollard
Laurent
CEA/D2NT/LLIT (France)
 
Prestigiacomo
Morgane
CRMCN (France)

"Chemical and electrical characterizations of deposits elaborated by focused ion beam assisted deposition"

 
Rochdi
Nabil
CRMCN (France)
 
Sarraf
Hamid
Institute of Chemical Technology (Czech Republic)
 
Turala
Artur
Ecole Centrale Lyon (France)
 


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